1 Indikator Teknik

1.1 Bayan cï kek gam

a. Voltage nominal: DC220V wala DC110V (ye wɛ̈t cï gɔ̈t)

b. AC data: AC voltage: 100/3 V wala 100V

Current: 5A wala 1A

Fɛɛr: 50Hz

c. Tɛɛr tɛɛr:

AC Voltage Circuit: Long run 1.2Un

AC Current Circuit: 2In ye luui në kaam juëc

1s 40In

d. Dynamic stability:

Half Week Wave: 100In

1.2 Kuɛl ye looi

a. AC voltage circuit: ka tɛmɛ 0.5VA në phase tök;

b. AC Current Circuit: In=5A, ye tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n

c. Gɛlɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye

1.3 Kä ye kɛ̈n

a. Tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

Luɔi: -10 ℃ ~ 55 ℃.

Lɔ̈ɔ̈i: -25 ℃ ~ + 70 ℃, kɔnɔ̈ɔ̈ŋ cïï bɛ̈n ya juak në 80%, kɔnɔ̈ɔ̈ŋ cïï bɛ̈n ya juak në ɣön cïï bɛ̈n ya juak në ɣön cïï bɛ̈n ya juak në ɣön cïï b Ka tɛ̈n ye kë ye cɔl a limit value, ka tɛ̈n ye kë ye cɔl a limit value, ka tɛ̈n ye kë ye cɔl a limit value, ka tɛ̈n ye kë ye cɔl a limit value, ka tɛ̈n ye kë ye cɔl a limit value.

b. Humidity relative: Humidity relative maximum average is 90% during the month most humid, and the minimum temperature during the month is 25°C and the surface does not condense. Humidity relative maximum is 90% during the month most humid, and the minimum temperature during the month is 25°C and the surface does not condense. N'a tɛmɛ +40°C, a tɛmɛ 50%.

c. Dɔɔr: 80kPa-110kPa (tɛ̈ɛ̈r tɛ̈ɛ̈r tɛ̈ɛ̈r tɛ̈ɛ̈r tɛ̈ɛ̈r tɛ̈ɛ̈r)

1.4 Anti-interference performance

a. Pulse group interference test: a lëu bï ya tɔ̈ɔ̈u në 1MHz ku 100kHz ye cɔl GB/T14598.13-2008 ye cɔl attenuation oscillation waves (first half wave voltage amplitude is 2.5kV, difference mode is 1kV) pulse group interference test.

b. Tɛɛr ye cɔl transient interference test: a lëu bï ya tɛɛr ye cɔl transient interference test ye cɔl transient interference test ye cɔl A class ye cɔl GB/T14598.10-2007 Chapter 4.

c. Radiation electromagnetic field interference test: a lëu bï ya tɔ̈ɔ̈u në radiation electromagnetic field interference test cïmën de GB/T14598.9-2002 Chapter 4.

D. Electrostatic discharge test: a lëu bï ya tɛ̈ɛ̈r në gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël de gël

e. Electromagnetic emission test: a lëu bï ya tɔ̈ɔ̈u në electromagnetic emission test ye cɔl conductive emission limit ye cɔl GB/T14598.16-2002 në 4.1 ku radiation emission limit ye cɔl GB/T14598.16-2002 në 4.2.

f. Tɛmɛ de magnetic field resistance test: a lëu bï ya tɛmɛ de magnetic field resistance test class IV cï gɔ̈ɔ̈r në GB/T17626.8-2006 Chapter 5.

g. Pulse magnetic field resistance test: a bɛ se ka kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

h. Kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ

i. Tɛ̈ɛ̈r de kë ye cɔl surge resistance test: a lëu bï ya tɛ̈ɛ̈r de kë ye cɔl surge resistance test class III cïmën de IEC 60255-22-5:2002 chapter 4.

j. Test de résistance à la perturbation de conduction: Test de résistance à la perturbation de conduction de induction de champs de radiofréquence cï kek lueel në IEC 60255-22-6:2001 Chapter 4.

k. Kuen de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de luɔɔi de lu

1.5 Kuen insulation

a. Resistance of insulation: ka cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈r ye cɛ̈ɛ̈

b. Medium strength: Device communication circuit and 24V such as weak power input and output terminals on the ground can withstand 50Hz, 500V (effective value) AC voltage, taking 1min inspection without breaking or flash phenomenon. b. Medium strength: Device communication circuit and 24V such as weak power input and output terminals on the ground can withstand 50Hz, 500V (effective value) AC voltage, taking 1min inspection without breaking or flash phenomenon. Kä ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye kek ye

c. wɛ̈ɛ̈r de wɛ̈ɛ̈r: wɛ̈ɛ̈r de wɛ̈ɛ̈r de wɛ̈ɛ̈r de wɛ̈ɛ̈r de wɛ̈ɛ̈r de wɛ̈ɛ̈r de wɛ̈ɛ̈r de wɛ̈ A ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ ye konnuŋ

1.6 Mechanical properties

A. Vibration response: Device can withstand the severe level 4.2.1 specified in GB/T 11287-2000 as a level I vibration response test. A. Vibration response: Device can withstand the severe level 4.2.1 specified in GB/T 11287-2000 as a level I vibration response test.

B. Wɛ̈ɛ̈r ye kɔc cɔl "impact response": A lëu bï ya tɛ̈ɛ̈r në wɛ̈ɛ̈r ye kɔc cɔl "impact response" në wɛ̈ɛ̈r ye kɔl "impact response" në wɛ̈ɛ̈r ye kɔ

c. Vibration durability: Device can withstand the severe grade 4.2.2 specified in GB/T 11287-2000 as the I-grade vibration durability test. c. Vibration durability: Device can withstand the severe grade 4.2.2 specified in GB/T 11287-2000 as the I-grade vibration durability test.

D. Kɔl ye cɔl impact durability: ye cɔl GB/T 14537-1993, ye cɔl impact durability test, ye cɔl class I, ye cɔl GB/T 14537-1993, ye cɔl GB/T 14537-1993, ye cɔl GB/T 14537-1993, ye cɔl GB/T 14537-1993.

e. Kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl ye kɔl