Keithley 2400/2420/2440

Features ye：

• Kuen 5 ye looi (IV source, IVR measurement)
• 6 mode: 20W ~ 100W DC, 1000W pulse, 1100V to 1μV, 10A to 10pA
• Kä ye kek looi ku kä ye kek looi (4 quadrant)
• 0.012% Basic measurement accuracy (6 bit half resolution)
• 2-wire, 4-wire ku 6-wire remote voltage source ku measurement sensing
• 1700 kuɛn/sec (4 bit half resolution), në GPIB
• Pass/Fail Comparator ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r
• Kuen de High Speed Sensor Line Contact Check
• Programmable DIO port for automation/handler/probe control (DIO port min bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi)
• SCPI GPIB, RS232 ku Gizli trigger link interface
• LabTracer 2.0 I-V Curve Tracking Application (Download)

Apparatu:

• Semiconductor Devices
• Ajuiɛɛr passive
• Ajuiɛɛr ye transient suppress
• IC、RFIC、MMIC
• Laser diode, laser diode module, LED、 Light Detector
• Ajuiɛɛr de gël: TVS, MOV, fuse, etc.
• Gas Bag
• Konektor, switch, relay

• Electrical leakage
• Low Voltage/Resistance (Voltage/Resistance)
• LIV
• IDDQ
• Analisis I-V
• Isolation ku Printing Line Resistance
• Temperature coefficient
• Voltage forward, reverse breaking, leakage current (Voltage forward, reverse breaking, leakage current) (Voltage forward, reverse breaking, leakage current) (Voltage forward, reverse breaking, leakage current)
• Testing DC Parameters
• DC Power
• HIPOT
• Misal de test de résistance de isolation

Kuen 5 ye looi (IV source, IVR measurement)
Kä ye kek mat thïn në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ në kä ye kek tïŋ Misal, a naŋ kaam ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye tɛm ye t A gël bɛ̈ɛ̈i tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈ Kä ye kek tɔ̈ɔ̈u ku kä ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ Na ye kë ye kɔr bɛ̈n ya tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ

Analisis I-V
Tabel de käke dijital ëbën aye 4 quadrant de luɔɔi gäm. Tɛ̈n yenë yen luui në 1 ku 3 quadrant, a bɛ̈n ya tɛ̈n yenë yen luui në load yic. Ka baara kɛ 2nd ku 4th quadrant, ka kɛ kɔnɔ (load) ka kɔnɔ. A lëu bï voltage, current ku resistance ya them në kaam de luɔɔi de source wala trap.

Automation kɛ pɛɛi
Digital Sources Table ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l. A bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛm Walasa ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ t

Scan standard ku scan custom
Scanning scheme ye tɔ̈u në hook ye automated hook ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë Wave-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye-ye

- Linear ladder scanning: ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l
- Logarithmic ladder scan: Scan ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r
- Custom Scanning: A kony bï a tɔ̈ɔ̈u në thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm de thëm
- Up to 1700 readings/second (4 bit half resolution), to GPIB bus
- 5000 kä ye kek kuɛ̈n në 6 bit semi-resolution alëu bï kek tɔ̈ɔ̈u në non-volatile buffer memory

Test sequencer cï gɔ̈t (source memory list)
Kä ye kek tɔ̈ɔ̈u në memory yic aye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ
- Ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u
- Pass/Failure Limit Test Speed up to 500μs/Test Point
- Board comparator ye kɔc cɔk tɛ̈n ye kɔc cɔk tɛ̈n ye kɔc cɔk tɛ̈n ye kɔc cɔk tɛ̈n ye kɔc cɔk tɛ̈n
- Built-in, user defined mathematical functions used to calculate derived parameters

I/O Interface Dijital
Digital I/O interfaces bɛ̈n lëu bɛ̈n ya tɔ̈ɔ̈u në käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke Kä kɔ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye:
· Compact system integration for sorting and sorting applications
· Built-in component handling program interface
· Test start and test end signals
· 5V, 300mA Power
· Optional extender accessories (2499-DIGIO type) adds 16 digital I/O lines

Trigger link interface
Digital Sources Table bɛ̈ɛ̈i anɔŋ Trigger Link Interface ye kɔc Gibraltar looi, min bɛ se ka jam tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ Misal, ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ Në tɛ̈n yenë kɔmpiöta ku GPIB ye tɛ̈n yenë kɔmpiöta ye tɛ̈n yenë kɔmpiöta ye tɛ̈n yenë kɔmpiöta ye tɛ̈n yenë kɔmpiöta ye tɛ̈n yenë kɔmpiöta ye tɛ̈n yen

Optional contact checking function
Ka tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ̈n yen tɛ Kɔn ye kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ, ku kä ye kek tɛmɛ. Kä ye kek looi aye:
· 350 μs Verification and Notification Processing Time
· Digital source table output bɛ̈n tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka t
3 pass/fail thresholds: 2Ω, 15Ω and 50Ω
· Ka tɛ̈n ye luui, ka tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n
· Lɔ̈ɔ̈i ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka tɔ̈u ka GPIB
· 3 dabareji bɛ̈ɛ̈r bɛ̈ɛ̈r bɛ̈ɛ̈r bɛ̈ɛ̈r bɛ̈ɛ̈r bɛ̈ɛ̈r

6-wire resistance measurement method
Digital source meter bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ. 6-line measurement method: 6-line measurement method: 6-line measurement method: 6-line measurement method: 6-line measurement method: 6-line measurement method: 6-line measurement method:
· Ka fara 4-line sensing ku source testing line, a tɛ̈n yenë kɔc gël ku kɔc gël ye tɛ̈n yenë kɔc gël ye tɛ̈n yenë kɔc gël ye tɛ̈n yenë kɔc gël ye.
· Lock parallel current path, when measuring resistance deviation or mixed circuit isolating the measured components · Lock parallel current path, when measuring resistance deviation or mixed circuit isolating the measured components · Lock parallel current path, when measuring resistance deviation or mixed circuit isolating the measured components
• Ka kɔc cï luɔ̈ɔ̈i ya cɔk tɔ̈u në 2400 series source tables yiic, ku ka kɔc cï luɔ̈ɔ̈i ya cɔk tɔ̈u në 2400 series source tables yiic, ka kɔc cï luɔ̈ɔ̈i ya cɔk tɔ̈u