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Japan Hitachi C Capacitive Tester HIOKI3504-40
A ye kɔc cï luɔ̈ɔ̈i në bɛ̈ɛ̈i kɔ̈k yiic, a ye kɔc cï luɔ̈ɔ̈i në bɛ̈ɛ̈i kɔ̈k yiic, a ye kɔc cï luɔ̈ɔ̈i në bɛ̈ɛ̈i kɔ̈k yiic, a ye kɔc cï luɔ̈ɔ̈i në bɛ̈
Detalji proizvoda
Professional Instrument Equipment & Test Solution Supplier <unk> JETYOO INDUSTRIAL & JETYOO INSTRUMENTSAgilent Agilent [now de KEYSIGHT] Product Technical Support Engineer - KEYJET ku KEITHLEY [now Tektronix] Product Technical Support Engineer - Yong YOO, a jɔl ya raan cï bɛ̈n cak në ruöön de 2011Teknoloji Applicationsa agent trading company,16 years focused on industrial testing industryA ye kɔrɔ gɛɛr! Kɔc juëc ye ɣɔɔc kä ye kek ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic, ku kɔc ye ɣɔɔc në baai yiic. AnTeknoloji SalesFɛɛr de undergraduate degree, ku fɛɛr de 10 years test industry experience, to our "rely on technology! sell instruments!" This advanced unique business philosophy, professional for the country users to provide instrument equipment, test solutions, technical training, maintenance and measurement services, for the industryInjiniyer teknolojiTechnology-oriented instrumentation equipment integrated service ye looi.
Japan Hitachi C Capacitive Tester HIOKI3504-40Karakteristika baara
Kɔɔrɔ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ
2ms ye tɛmɛ
A bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ
Kɔɔr test line, comparator function/trigger output function
3504-60/-50 ye tɛmɛ BIN ye tɛmɛ BIN ye tɛmɛ BIN ye tɛmɛ BIN ye tɛmɛ BIN ye tɛmɛ BIN ye tɛmɛ BIN ye tɛmɛ BIN
3504-40 Recording Tools for High Speed/Low Cost Testing (Kɔl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl-kɛl)
Lɔ̈k kɛ̈ɛ̈r ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr
Lɔ̈k probe / test fixture, entity wala tɔ̈u. Ka tɛmɛ kä ye kek them, ka tɛmɛ kä ye kek them, ka tɛmɛ kä ye kek them, ka tɛmɛ kä ye kek them, ka tɛmɛ kä ye kek them, ka tɛmɛ kä ye kek them
Japan Hitachi C Capacitive Tester HIOKI3504-40Parameters ye raan
Parameters ye them Cs, Cp (capacitive), D (loss coefficient tanδ)
Range de mesure C:0.9400pF～20.0000mF，D:0.00001～1.99000
Basic precision C: ±0.09% rdg. ±10 dgt., D: ±0.0016, tɛmɛ tɛmɛ = tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ
Frequency ye them 120Hz, 1kHz
Tekki signal level Tɛ̈n yenë yen tɔ̈u thïn: 100mV (3504-60 dɔɔni), 500 mV, 1 V
Kuɛl:
CV 100mV: ~ 170μF Measuring Range (Measuring Frequency 1kHz), ~ 1.45mF Measuring Range (Measuring Frequency 120Hz)
CV 500mV: ~ 170μF measuring range (measuring frequency 1kHz), ~ 1.45mF measuring range (measuring frequency 120Hz)
CV 1V: ~ 70μF measuring range (measuring frequency 1kHz), ~ 700μF measuring range (measuring frequency 120Hz)
Resistance output 5Ω (të cenë yen tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u tɔ̈u)
Nyuɔ̈th Luminous secondary tube (6 bit representation, full scale calculator based on the scale)
Wakt tɛmɛ Kä ye kek tïŋ: 2.0 ms (1 kHz, FAST) Wakat ye kek tïŋ aye wuɔ̈ɔ̈r në kë de kaam ye kek tïŋ ku kaam ye kek tïŋ
Funksiɔn BIN classification measurement (excluding 3504-40), trigger synchronous output, measurement condition memory, measuring value comparison function, average value function, Low-C screening function, vibration function, control output input (EXT. I/O), RS-232C interface (standard), GP-IB interface (excluding 3504-40)
Power AC 100/120/220/240V ±10% (lëu bï ya kuanycök), 50/60Hz, maximum 110VA
Volume ku Weight 260W × 100H × 220Dmm, 3.8kg
Aksesɛr Power cable × 1, prep power fuse × 1, manual of use × 1
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