Shanghai Man and Science Instruments Co., Ltd. (Shanghai Man and Science Instruments Co., Ltd.)
Kuæa>Proizvodi>GFM Portable 3D Optical Defect Phase Difference Meter
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GFM Portable 3D Optical Defect Phase Difference Meter
Kɔnɔ, teliya, portable application field: metal, composite materials, fabric and other materials surface scratching, cracking, wear, scratching, cavit
Detalji proizvoda


A yic, a yic, a portable

Lappol:

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3-dimensional detection of riveting, welding, seams and other phase differences and convex volumes; 3-dimensional detection of riveting, welding, seams and other phase differences and convex volumes; 3-dimensional detection of riveting, welding, seams and other phase differences and convex volume 3D surface roughness measurement analysis;

Geometric size measurement of nesting holes, groove depth, circular arc, reversed angle etc.;

Prinsip measure

GFM, Germany, ye tɛ̈n yenë laser stripe phase projection technology ku DSP high speed image processing chip looi, ye tɛ̈n yenë 3D optical surface scratch gauge looi, ye tɔ̈u yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen yen

Karakteristika instrumenti:

Portable field detection of large parts surface scratch defects, phase differences and other surface geometry characteristics parameters. Portable field detection of large parts surface scratch defects, phase differences and other surface geometry characteristics parameters. Portable field detection of large parts surface scratch defects, phase differences and other surface geometry characteristics parameters.

3D measure surface scratch defects, to visually detect the deepest part of scratch defects through topological color difference chart. 3D measure surface scratch defects, to visually detect the deepest part of scratch defects through topological color difference chart.

Professional scratch measurement analysis software, various filtering methods: contains polynomial filtering, gaussian filtering, average filtering etc., effectively eliminating curvature contour, inclination, noise signals, bursts, dust etc. factors on the measurement results. The software of scratch measurement analysis, various filtering methods: contains polynomial filtering, gaussian filtering, average value filtering etc., effectively eliminating curvature contour, inclination, noise signals, bursts, dust etc. factors on the measurement results.

Large inclination optical path design, and blue light LED light source, measuring not affected by high reflective curvature.

SDK software package, open instrument interface, can be developed twice; SDK software package, open instrument interface, can be developed twice; SDK software package, open instrument interface, can be developed twice; SDK software package, open instrument interface, can be developed twice;

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