Član VIP
Sisit?m de g?l de insulation degradation ku ion migration characteristics
Isolation degradation and ion migration characteristics evaluation system faces increasingly small lightweight and high density packaging of electroni
Detalji proizvoda
Wël kɔ̈k:
Sisitɛm de gël de insulation degradation ku ion migration characteristicsLuɔi:
Ka tɛ̈n yenë kä ye kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek looi ya tɛ̈n yenë kek
Sisitɛm de gël de insulation degradation ku ion migration characteristicsLööŋ:
JPCA-ET04、IPC-TM-650_2.6.3F、IPC-TM-650_2.6.3.1E、IPC-TM-650_2.6.3.4A、IPC-TM-650_2.6.3.6.
Sisitɛm de gël de insulation degradation ku ion migration characteristicsTeknoloji:
|
Nyuɔ̈ɔ̈r Produk |
Sisitɛm de gël de insulation degradation ku ion migration characteristics |
|||||||||||
|
Model |
SIR13 |
|||||||||||
|
120VSubstrate |
250VSubstrate |
500VSubstrate |
1000VSubstrate |
|||||||||
|
Departemen Testing Substrate |
Testing Resistance Range |
320Ω ye～120TΩ |
320Ω ye～2.5TΩ |
320Ω ye～250TΩ |
320Ω ye～500TΩ |
320Ω ye～1000TΩ |
||||||
|
Tɛst kanal |
8ch/Substrate |
16ch/Substrate |
8ch/Substrate |
|||||||||
|
Kabel konneksi |
2Root pair/Substrate 4Linear |
2Root pair/Substrate Loading Test Cable (Kabel tes)×2 |
2Root pair/Substrate Loading kabel×1Test kabel×1 |
|||||||||
|
Karakteristika elektrik |
Elektrik Pressure Ka Load Departemen |
Loading Voltage (Loading Voltage) |
Voltage measurement (Voltage measurement)1 |
0.10V～120.00V |
0.1V～250.0V |
1.0V～500.0V |
1.0V～1000.0V |
|||||
|
Voltage measurement (Voltage measurement)2 |
0.100V～12.000V |
-- |
-- |
-- |
||||||||
|
Loading Setting Resolution (Loading Setting Resolution) |
0.10V/0.001V |
0.1V |
||||||||||
|
Basic Loading Precision |
±0.3%/FS |
±0.3%/FS + 0.5V/FS |
||||||||||
|
Puɔth output |
96mW/ch |
256mW/8ch |
300mW/h |
|||||||||
|
Loading grup |
1Grup (1ch/1grup) |
2Grup (8ch/1grup) |
1Grup (8ch/1grup) |
|||||||||
|
Loading Length |
2Skala |
1Skala |
||||||||||
|
Loading Channels |
1ch |
8ch |
||||||||||
|
Load capacity dït |
2.0μF/1ch |
0.47μF/8ch |
3300pF/1ch |
|||||||||
|
Elektrik Pressure Nyuɔ̈th Nyuɔ̈th Masin |
Display size |
2Skala |
1Skala |
|||||||||
|
Nyuɔ̈th Range |
Voltage measurement (Voltage measurement)1 |
0.00V～120.00V |
0.0V～250.0V |
0.0～500.0V |
0.0V～1000.0V |
|||||||
|
Voltage measurement (Voltage measurement)2 |
0.000V～12.000V |
-- |
-- |
-- |
||||||||
|
Resolution display |
0.10V/0.001V |
0.1V |
||||||||||
|
Basic Display Precision |
±0.3%/FS |
±0.3%/FS + 0.5V/FS |
||||||||||
|
Display splitter unit |
1ch |
1Grup wala1ch |
1ch |
|||||||||
|
Period display |
40ms |
|||||||||||
|
Nomer kanal nyuɔth |
8ch |
16ch |
8ch |
|||||||||
|
Elektrik Stream Testing Testa |
Testing Scale |
3Skala |
2Skala |
3Skala |
||||||||
|
Nyuɔ̈th Range |
Current measurement1 |
0.00μA～320.00μA |
||||||||||
|
Current measurement2 |
0.0000μA～3.2000μA |
|||||||||||
|
Current measurement3 |
0.00nA～32.000nA |
-- |
0.000nA～32.000nA |
|||||||||
|
Kɔmpiye |
320.00μA·3.2000μA ·32.000nA·Otomatik |
320.00μA·3.2000μA·Otomatik |
320.00μA·3.2000μA·32.000nA·Otomatik |
|||||||||
|
Testing Small Resolution (Testing Small Resolution) (Testing Small Resolution) (Testing Small Resolution) (Testing Small Resolution) (Testing Small Resolution) (Testing Small Resolution) |
Current measurement1 |
10nA |
10nA |
10nA |
||||||||
|
Current measurement2 |
100pA |
100pA |
100pA |
|||||||||
|
Current measurement3 |
1pA |
1pA |
1pA |
|||||||||
|
Testing Precision |
±0.3%/FS |
|||||||||||
|
Kanɛl |
8ch |
16ch |
8ch |
|||||||||
|
Data Collection Period |
Ka tɛmɛ30s(Kic)/Loktu Ion Migration40ms(Kic) |
|||||||||||
|
Ion Migration Test Speed (Ion Migration Test Speed) |
40ms |
|||||||||||
|
Lëk yök |
400 μs/h |
|||||||||||
|
Test Period |
40ms |
|||||||||||
|
Funksiɔn wɛr |
Diagnostic yɛrɛ |
Ajuiɛɛr de resistivité ※Awowa |
||||||||||
|
Chain |
Testing automatic interruption function when box door is opened (Testing automatic interruption function when box door is opened) (Testing automatic interruption function when box door is opened) ※Awowa |
|||||||||||
|
Kɔnɔ tɔ̈ɔ̈u |
Terminal disconnect detection function |
-- |
||||||||||
|
Tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ |
Add temperature and humidity testing substrate, using3CS·keylessSoftware kura lëu gɔ̈t4Data Slot ※Awowa |
|||||||||||
|
Sample Temperature Collection |
Ka3CS SMUKanal bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i1Point ※Awowa |
|||||||||||
|
Sistɛm kura |
SIR13 |
80ch（10substrate) |
160ch（10substrate) |
80ch（10substrate) |
||||||||
|
SIR13mini |
24h（3substrate) |
48ch（3substrate) |
24h（3substrate) |
|||||||||
|
Departemen Kontrol |
Sistem Kontrol Komputer |
Windows XP Pro. SP2Suitable forWindows 2000）Pentium 500MHzYɔ̈ɔ̈k Memori256MbyteYɔ̈ɔ̈k |
||||||||||
|
Testing Department Connection |
GP-IBwalaEthernet |
|||||||||||
|
Wɛɛr |
Lɔ̈k kony |
A tɔ̈ɔ̈u data cï gɔ̈t ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ※Power supply must not stop |
||||||||||
|
Kontrol unit |
Struktur jili |
SIR13 |
SMU 10Slot DimensionsW430×H300×D620※Wala tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n Weight: ye30kg（SMU 10sa ka tɔ̈ɔ̈u) Current ye luɔ̈ɔ̈i:5ADɔŋ (100Vtɛ̈n yen luɔ̈ɔ̈i) |
|||||||||
|
SIR13mini |
SMU 3Slot DimensionsW220×H370×D390※Wala tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n Weight: ye20kg（SMU 3sa ka tɔ̈ɔ̈u) Current ye luɔ̈ɔ̈i:2ADɔŋ (100Vtɛ̈n yen luɔ̈ɔ̈i) |
|||||||||||
|
Capacity of noise |
1μsPulse2KV 1Minit |
|||||||||||
|
Resistance insulation |
DC500V 100MΩYɔ̈ɔ̈k |
|||||||||||
|
Power ye luɔ̈ɔ̈i |
AC85V～264V 50/60Hz |
|||||||||||
|
Luɔi Environment |
Temperatur+10℃～+40℃ Humidity75% RHDɛ̈n (ka tɔ̈ɔ̈u) |
|||||||||||
|
Gäm ɣän |
Temperatur-10℃～+ 60℃ |
|||||||||||
Sisitɛm de gël de insulation degradation ku ion migration characteristics Foto Produk
Онлайн разпит
-
Kontakti
-
Kompanija
-
Telefon
-
E-mail
-
WeChat
-
Kod provjere
-
Сједност поруки
-