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A-4XC reverse gold phase microscope
A-4XC reverse gold phase microscope
Detalji proizvoda
Product Introduction
A-4XCMikroskop Metalfase InvertedA ye mikroskop ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r ye dɔ̈ɔ̈r1000times, a lëu bï polarization tïŋ;
Mikroskop alëu bï ya tɔ̈ɔ̈u kek kamera dijital, ku fotow mikroskop alëu bï ya tɔ̈ɔ̈u kek ya tɔ̈ɔ̈u kek ya tɔ̈ɔ̈u kek ya tɔ̈ɔ̈u.
3Mikroskop Metalfase Inverteda bɛ looi ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka Kuen de kä ye kek looi; Kuen de käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke käke Ku bɛ̈ɛ̈i dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ɔ̈r dɔ̈ A nɔŋ tɔ̈u në luɔɔi, laboratory, ku piöc ku puɔ̈ɔ̈c.
Lɔ̈ɔ̈m ye kɔrɔ piny, ka tɛ̈n ye kɔrɔ piny, ka tɛ̈n ye kɔrɔ piny, ka tɛ̈n ye kɔrɔ piny, ka tɛ̈n ye kɔrɔ piny, ka tɛ̈n ye kɔrɔ piny, ka tɛ̈n ye kɔrɔ pin
Instrument design and manufactured fine, complete configuration, suitable for metallic structure and observation analysis of infiltration, coating, melting depth and cracking etc. Instrument design and manufactured fine, complete configuration, suitable for metallic structure and observation analysis of infiltration, coating, melting depth and cracking etc. Instrument design and manufactured fine, complete configuration, suitable for metallic structure and observation analysis of infiltration, coat
Focus lens group and lift and drop focus mechanism with locking device, can prevent sample and lens collision, adapt to large-scale detection, improve work efficiency. Focus lens group and lift and drop focus mechanism with locking device, can prevent sample and lens collision, adapt to large-scale detection, improve work efficiency.
Mikroskop ee yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic ye yic
Parameters teknis
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Specifications |
Parameters teknis |
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Sistem optik |
Total magnification |
50X、100×、200×、500×、1000× |
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Lens ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t |
5X、10×、20×、50×、100×(Dry lens) |
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Glasses Wide Field |
WF10×/18mm |
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Fittings for measuring |
Glasses divide Mikrometer |
※ 10×Zoom0.1/18mmMikrometer0.01/1mm |
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Struktur instrument |
Struktur dasar |
Optical output reversible triple-eyed lens hinged angle45°Distance ye55-75mmRefractivity±5%Adjustable |
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Lens Converter |
5Hole Ball |
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Double Layer Mechanical Carrier Table |
180x150mmRange move70x50mm Kargo BoardΦ10/Φ20 mm |
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Focus Mechanism |
Coaxial Thickness Miniature Dynamic Lifting Range30 mmLuɔi Grid0.002mmLift-and-drop lock tightening and torque adjustment (Lift-and-drop lock tightening and torque adjustment) (Lift-and-drop lock tightening and torque adjustment) |
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Lighting System |
Lighting |
Köhler Lighting Variable aperture and visual field light bar Luminous adjustable halogen lamp20W/6VFilter:Yellow ye/Green/Blue/Sand |
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Polarizer |
Polarizer ye lëu tɔ̈ɔ̈u,Vertical lighting devices can't only do general metallic phase analysis, particle analysis testing, but can also analyze and observe non-transparent objects. Vertical lighting devices can't only do general metallic phase analysis, particle analysis testing, but can also analyze and observe non-transparent objects. |
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Power |
Puwol Input |
AC220V/50Hz 30VA |
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Paket |
Kɛnɛya |
Instrument Weight:10KgPackaging Volume (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long) (Long)xWidthxdït)340x400x460Cm |
Objektif
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Objects ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t ye dɛ̈t |
Aperture de chiffreNA |
Distance de luɔimm |
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PL5X(Lɛns) |
0.12 |
35.4 |
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PL10X(Lɛns) |
0.25 |
15.3 |
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PL20X(Lɛns) |
0.40 |
7.46 |
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PL50X(Lɛns) |
0.7 |
0.63 |
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PL100X(Lɛns) |
0.85 |
0.18 |
Konfigurasiɔn Standart
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⑴Instrument Host 1Taiyi |
⑷Glasses2a |
⑺Tabel Kargo2Film |
(10)Kabel Power1root |
⒀Instrument dust cover1a |
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⑵Glasses1Grup |
⑸Glasses divide1a |
⑻Spring ye looi1Grup |
(11)Lampu ye dɔ̈ŋ2a |
⒁File Random1Set |
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⑶Objektif 5a |
⑹Mikrometer1Film |
⑼Filter4Film |
⑿Fuse ye kɔ̈k1Branch |
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Aksesori sugandi
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A.Glasses and Objectives: Different magnifications |
B.Metaphase Image Analysis Measurement Software (Basic Type) (Software ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n |
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C.Jin Phang Automatic Rating Software (Jin Phang Automatic Rating Software)Profesional) |
D.Brand Komputer |
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